| 000 | 00308nab a2200109Ia 4500 | ||
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| 008 | 230808s1995 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aSachdev, Manoj _9803012 |
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| 245 | 0 | _aTesting Defects in Scan Chains. | |
| 300 | _a45-51 p. | ||
| 773 |
_d1995 _tIeee Design and Test of Computers _x07407475 |
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| 942 |
_cART _o51 _pABUL KALAM Library |
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| 999 |
_c806238 _d806238 |
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