| 000 | 00593nab a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1997 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aQian, J _9167850 |
||
| 100 |
_aChang, C. W _9765698 |
||
| 100 |
_aChen, C. M _9676017 |
||
| 245 | 0 | _aNondestructive Determination of Electromagnetic Parameters of Dielectric Materials At X-Band Frequencies Using A Waveguide Probe System. | |
| 300 | _a1084-1092 p. | ||
| 650 |
_aCalibration of Probe System _9857604 |
||
| 650 |
_aX-Band Frequency _9857605 |
||
| 773 |
_d1997 _tIeee Transactions on Instrumentation and Measurement _x00189456 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c798925 _d798925 |
||