000 00496nab a2200157Ia 4500
008 230808s2000 |||||||f |||| 00| 0 eng d
100 _aXu, Z
_9719261
100 _aZhang, B
_9676501
100 _aHuang, A. Q
_9811835
245 3 _aAn Analysis and Experimental Approach to Mos Controlled Diodes Behavior.
300 _a916-922 p.
650 _aMos Controlled Diodes
_9841866
650 _aPin Diodes
_9794672
773 _d2000
_tIeee Transactions on PowerElectronics
_x08858993
942 _cART
_o51
_pABUL KALAM Library
999 _c786538
_d786538