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_aKuhn, H _9840048 |
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_aMnatsakanov, T. T _9840049 |
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_aSchlogl, A. E _9840050 |
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| 245 | 0 | _aTemperature Dependent Characterization on Bipolar Silicon Power Semiconductors- A New Physical Model Validated By Device - Internal Probing Between 400-100k. | |
| 300 | _a1267-1274 p. | ||
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_aMobility _9164527 |
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_aPhysical Modeling _9162082 |
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| 773 |
_d2000 _tIeee Transactions on PowerElectronics _x08858993 |
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| 942 |
_cART _o51 _pABUL KALAM Library |
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_c785076 _d785076 |
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