| 000 | 00596nab a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2001 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aShen, W _9830136 |
||
| 100 | _aTang, C.Y | ||
| 100 |
_aLi, W. _9739362 |
||
| 100 |
_aPeng, L.H _9830140 |
||
| 245 | 0 | _aDetermining Young'S Modulus of Conductive Thin Films By A Thermal Band Beam Test | |
| 300 | _a163-168 p. | ||
| 650 |
_aYoung'S Modulus _9174252 |
||
| 650 |
_aConductive Thin Film _9830141 |
||
| 650 |
_aElectrothermal Effect _9830143 |
||
| 773 |
_d2001 _tThe Journal of Strain Analysis for Engineering Design _x03093247 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c778342 _d778342 |
||