| 000 | 00434nab a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2001 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aZarrineh, Kamran _9826249 |
||
| 245 | 0 | _aSystem-on-Chip Testability Using Lssd Scan Structures | |
| 300 | _a83-97 p. | ||
| 650 |
_aSystem on Chip _9767191 |
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| 650 |
_aTestability Using Lssd Scan Structures _9810607 |
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| 773 |
_d2001 _tIeee Design and Test of Computers _x07407475 |
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| 942 |
_cART _o51 _pABUL KALAM Library |
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| 999 |
_c777839 _d777839 |
||