| 000 | 00438nab a2200121Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aChen, C.-H. _9431863 |
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| 245 | 0 | _aDetermination of Deep Ultrathin Equivalent Oxide Thickness (Eot) from Measuring Flat-Band C-V Curve | |
| 300 | _a695-698 p. | ||
| 650 |
_aSolid-State Power and High Voltage _9797047 |
||
| 773 |
_d2002 _tIeee Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
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| 999 |
_c777093 _d777093 |
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