000 00484nab a2200145Ia 4500
008 230808s2000 |||||||f |||| 00| 0 eng d
100 _aKoffman, A. D
_9826859
100 _aOldham, N. M
_9805807
245 4 _aThe Sensitvity of A Method to Predict Capacitor'S Rrequency Characteristic.
300 _a398-404 p.
650 _aCapacitance
_9707591
650 _aHigh Frequency
_990052
773 _d2000
_tIeee Transactions on Instrumentation and Measurement
_x00189456
942 _cART
_o51
_pABUL KALAM Library
999 _c777066
_d777066