| 000 | 00548nab a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aNicolici, N _9822384 |
||
| 100 |
_aAl-Hashimi, B M _9793492 |
||
| 245 | 0 | _aMultiple Scan Chains for Power Minimization During Testing Application in Sequential Circuits | |
| 300 | _a721-734 p. | ||
| 650 |
_aScan-During-Sustaion(Sds)Method. _9828500 |
||
| 650 |
_aChain and Design Process _9828501 |
||
| 650 |
_aPrototyping _9755037 |
||
| 773 |
_d2002 _tIEEE TransactionsonComputers _x00189340 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c777062 _d777062 |
||