| 000 | 00524nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aVenuto, D. De _9810603 |
||
| 100 |
_aKayal, M. _9824221 |
||
| 100 |
_aOhletz, M.J. _9810604 |
||
| 245 | 0 | _aFault Detection in Cmos/Soi Mixed-Signal UsingQuiescent Current Test | |
| 300 | _a387-398 p. | ||
| 650 |
_aQuiescent Current _9778653 |
||
| 650 |
_aSilicon Wafer _9779514 |
||
| 650 |
_aKink-Effect _9777266 |
||
| 773 |
_d2002 _tMicroelectronics Journal _x00262692 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c774270 _d774270 |
||