| 000 | 00474nab a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aSell, Bernhard _9822803 |
||
| 245 | 0 | _aFast Interface Characterization of Tunnel Oxide Mos Structures | |
| 300 | _a110-113 p. | ||
| 650 |
_aCapacitance Measurement _9777238 |
||
| 650 |
_aFlatband Potential _9822805 |
||
| 650 |
_aOxide Thickness _9810475 |
||
| 773 |
_d2002 _tIeee Transactions on Nanotechnology _x1536125X |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c773396 _d773396 |
||