000 00530nab a2200133Ia 4500
008 230808s2002 |||||||f |||| 00| 0 eng d
100 _aLuo, J
_9676584
245 0 _aNormalized Kemeny and Snell Distance: A Novel Metric for Quantitative Evaluation of Rank-Order Similarity of Images
300 _a1147-1151 p.
650 _aStatistical Pattern Recognition
_9677179
650 _aStatistical Pattern Analysis
_9822053
773 _d2002
_tIeee Transactions on Pattern Analysis and Machine Intelligence
_x01628828
942 _cART
_o51
_pABUL KALAM Library
999 _c772747
_d772747