| 000 | 00595nab a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aDessard, V _9780092 |
||
| 100 |
_aIniguez, B _9780090 |
||
| 100 |
_aAdriaensen, S _9815934 |
||
| 100 |
_aFlandre, D _9780093 |
||
| 245 | 0 | _aSoi N-Mosfet Low-Frequency Noise Measurements and Modeling from Room Temperature Up to 250 C | |
| 300 | _a1289-1295 p. | ||
| 650 |
_aBody Effects _9768301 |
||
| 650 |
_aLorentzian _9808267 |
||
| 650 |
_aNoise Measurement _9808651 |
||
| 773 |
_d2002 _tIeee Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c772482 _d772482 |
||