000 00486nab a2200145Ia 4500
008 230808s2002 |||||||f |||| 00| 0 eng d
100 _aGarcia, E
_9675996
100 _aGarcia, Marcelo H
_9811087
245 0 _aFlatness Measurement System Based on A Nonlinear Optical Traiangulation Technique
300 _a188-195 p.
650 _aFlatness Fo Group Delay
_9820317
650 _aLaser
773 _d2002
_tIeee Transactions on Instrumentation and Measurement
_x00189456
942 _cART
_o51
_pABUL KALAM Library
999 _c771265
_d771265