000 00421nab a2200133Ia 4500
008 230808s2003 |||||||f |||| 00| 0 eng d
100 _aSavir, J
_9783404
100 _aGuo, Z
_9745485
245 0 _aTest Limitations of Parametric Faults in Analog Circuits
300 _a1444-1454 p.
650 _aAnalog Circuits
_9673429
773 _d2003
_tIeee Transactions on Instrumentation and Measurement
_x00189456
942 _cART
_o51
_pABUL KALAM Library
999 _c769510
_d769510