000 00522nab a2200145Ia 4500
008 230808s2002 |||||||f |||| 00| 0 eng d
100 _aTschanz, James W.
_9805614
100 _aKao, Jaems T
_9770484
245 0 _aAdaptive Body Bias for Reducting Impacts of Die-to Die and within-Die Parameter Variations on Microprocessor Frequency Adn Leakage
300 _a1396-1402 p.
650 _aBody Bias
_9768246
650 _aMicroprocessors
773 _d2002
_tIeee Journal of Solid-State Circuits
_x00189200
942 _cART
_o51
_pABUL KALAM Library
999 _c766396
_d766396