000			00510nab a2200133Ia 4500
008			230808s2002 |||||||f |||| 00| 0 eng d
100			_aLee, J. -S. _9755853
245		2	_aA Study of Stress-Induced P+/N Salicided Junction Leakage Failure and Optimized Process Conditions for Sub-0.15-Um Cmos Technology
300			_a1985-1992 p.
650			_aParkdale Develop Designer Fiber _9813404
650			_aYoung'S Modulus _9174252
773			_d2002 _tIeee Transactions on Electron Devices _x00189383
942			_cART _o51 _pABUL KALAM Library
999			_c765575 _d765575