| 000 | 00454nab a2200121Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aPomeranz, I. _9812334 |
||
| 245 | 2 | _aA Storage-Based Built-In Test Pattern Generation Method for Scan Circuits Based on Partitioning and Reduction of A Precomputed Test Set | |
| 300 | _a1282-1293 p. | ||
| 650 |
_aBuilt-In Self-Test _9774421 |
||
| 773 |
_d2002 _tIEEE TransactionsonComputers _x00189340 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c764644 _d764644 |
||