| 000 | 00430nab a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2003 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aStancic, M. _9810606 |
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| 245 | 0 | _aTestability Analysis Driven Test-Generation of Nalogue Cores | |
| 300 | _a913-917 p. | ||
| 650 |
_aTestability Using Lssd Scan Structures _9810607 |
||
| 650 |
_aControllability _9810608 |
||
| 773 |
_d2003 _tMicroelectronics Journal _x00262692 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
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| 999 |
_c763255 _d763255 |
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