000 00537nab a2200169Ia 4500
008 230808s2003 |||||||f |||| 00| 0 eng d
100 _aMorvan, Erwan
_9808416
100 _aSghaier, Nabil
_9808417
100 _aSouifi, Abdelkader
_9808418
245 0 _aStudy of Trapping Phenomenon in 4h Sic Mesfets Dependence on Substrate Purity
300 _a297-302 p.
650 _aHtcvd
_9808420
650 _aTrapping
_9707309
650 _aMesfets
_9777036
773 _d2003
_tIeee Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c761455
_d761455