000 | 00459nab a2200145Ia 4500 | ||
---|---|---|---|
008 | 230808s2003 |||||||f |||| 00| 0 eng d | ||
100 |
_aLi, Erhong _9808381 |
||
100 |
_aPrasad, Sharad _9808383 |
||
245 | 0 | _aChannel Width Dependence of Nmosfet Hot Carrier Degradation | |
300 | _a1545-1548 p. | ||
650 |
_aImpact Ionization _9771576 |
||
650 |
_aChannel Width _9808385 |
||
773 |
_d2003 _tIeee Transactions on Electron Devices _x00189383 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c761426 _d761426 |