| 000 | 00459nab a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2003 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aLi, Erhong _9808381 |
||
| 100 |
_aPrasad, Sharad _9808383 |
||
| 245 | 0 | _aChannel Width Dependence of Nmosfet Hot Carrier Degradation | |
| 300 | _a1545-1548 p. | ||
| 650 |
_aImpact Ionization _9771576 |
||
| 650 |
_aChannel Width _9808385 |
||
| 773 |
_d2003 _tIeee Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c761426 _d761426 |
||