000 00413nab a2200121Ia 4500
008 230808s2003 |||||||f |||| 00| 0 eng d
100 _aKer, Ming-Dou
_9345909
245 0 _aEsd Implantation for Subquarter-Micron Cmos Technology to Enhance Esd Robustness
300 _a2126-2134 p.
650 _aElectrostatic Discharge (Esd)
773 _d2003
_tIeee Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c760605
_d760605