000 00402nab a2200121Ia 4500
008 230808s2004 |||||||f |||| 00| 0 eng d
100 _aHan, Kwangseok
_9760779
245 0 _aAnalytical Drain Thermal Noise Current Model Valid for Deep Submicron Mosfets
300 _a261-269 p.
650 _aCarrier Heating
_9802476
773 _d2004
_tIeee Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c757803
_d757803