| 000 | 00531nab a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2004 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aKwon, Hyuck In _9803360 |
||
| 100 |
_aKang, in Man _9710212 |
||
| 245 | 4 | _aThe Analysis of Dark Signals InCmos Aps Imagers fromCharacterization of Test Structures | |
| 300 | _a178-184 p. | ||
| 650 |
_aCmos Active Pixel _9769483 |
||
| 650 |
_aDark Signals _9803361 |
||
| 650 |
_aDeep-Level Bulk Traps _9803362 |
||
| 773 |
_d2004 _tIeee Journal of Solid-State Circuits _x00189200 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c757680 _d757680 |
||