000 00510nab a2200157Ia 4500
008 230808s2004 |||||||f |||| 00| 0 eng d
100 _aYu Yu, Hong
_9802608
100 _aLi, Ming-Fu
_9331582
245 0 _aThermally Robust Hfn Metal As A Promising Gate Electrode for Advanced Mos Device Applications
300 _a609-615 p.
650 _aCmos Device
_9801110
650 _aHfn
_9802609
650 _aMetal Gate
_9800730
773 _d2004
_tIeee Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c757264
_d757264