000 00517nab a2200157Ia 4500
008 230808s2004 |||||||f |||| 00| 0 eng d
100 _aPan, J
_9237797
100 _aWoo, Christy
_9802601
245 4 _aThe Effect of Annealing Temperatures on Self-Ailned Replacement (Damascene) Tacn-Tan-Stacked Gate Pmosfets
300 _a581-586 p.
650 _aCarbon
_950196
650 _aMetal Gate
_9800730
650 _aPmosfets
_9778081
773 _d2004
_tIeee Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c757260
_d757260