000 00492nab a2200145Ia 4500
008 230808s2004 |||||||f |||| 00| 0 eng d
100 _aHan, Kwangseok
_9760779
100 _aShin, Hyungcheol
_9802475
245 0 _aAnalytical Drain Thermal Noise Current Model Valid for Deep Submicron Mosfets
300 _a261-269 p.
650 _aCarrier Heating
_9802476
650 _aChannel Length Modulation
_9708229
773 _d2004
_tIeee Journal of Solid-State Circuits
_x00189200
942 _cART
_o51
_pABUL KALAM Library
999 _c757196
_d757196