| 000 | 00483nab a2200157Ia 4500 | ||
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| 008 | 230808s2004 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aZhang, Jian F. _9799641 |
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| 100 |
_aZhao, Ce Z. _9799642 |
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| 245 | 0 | _aHole Traps in Silicon Dioxides-Part I: Properties | |
| 300 | _a1267-1273 p. | ||
| 650 |
_aAnomalous _9719304 |
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| 650 |
_aBorder Traps _9799645 |
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| 650 |
_aBreakdown Process _9697923 |
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| 773 |
_d2004 _tIeee Transactions on Electron Devices _x00189383 |
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| 942 |
_cART _o51 _pABUL KALAM Library |
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| 999 |
_c755203 _d755203 |
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