| 000 | 00384nab a2200121Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2005 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aGopalakrishnan, K _9796959 |
||
| 245 | 0 | _aImpact Ionization Mos (I-Mos) Part I: Device and Circuit Simulations | |
| 300 | _a69-76 p. | ||
| 650 | _aSilicon Devices | ||
| 773 |
_d2005 _tIeee Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c753441 _d753441 |
||