| 000 | 00379nab a2200121Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2005 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aSheu, Y M _9796949 |
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| 245 | 0 | _aModeling Mechanical Stress Effect on Dopant Diffusion in Scaled Mosfets | |
| 300 | _a30-38 p. | ||
| 650 | _aSilicon Devices | ||
| 773 |
_d2005 _tIeee Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c753433 _d753433 |
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