000 | 00414nab a2200121Ia 4500 | ||
---|---|---|---|
008 | 230808s2005 |||||||f |||| 00| 0 eng d | ||
100 |
_aO'Mahony, C _9794431 |
||
245 | 0 | _aLow-Voltage Micromechanical Test Structures for Measurement of Residual Charge in Dielectrics | |
300 | _a409-410 p. | ||
650 | _aInstrumentation and Measurement | ||
773 |
_d2005 _tIET:IEE: Electronics Letters _x00135194 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c752074 _d752074 |