| 000 | 00514nab a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1981 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aReddy, S. M. _9492673 |
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| 100 |
_aSuk, D.S. _9792537 |
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| 245 | 2 | _aA March Test for Functional Faults in Semiconductor Random Access Memories | |
| 300 | _a982-985 p. | ||
| 650 |
_aFunctional Faults _9792538 |
||
| 650 |
_aLower Bounds _9753464 |
||
| 650 |
_aRandom Access Memory (Ram) _9769045 |
||
| 773 |
_d1981 _tIEEE Transactions on Computers _x00189340 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c750861 _d750861 |
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