000 00517nab a2200157Ia 4500
008 230808s1991 |||||||f |||| 00| 0 eng d
100 _aChung, S W
_9791397
100 _aBai, D S
_9787872
245 3 _aAn Optimal Design of Accelerated life Test for Exponential Distribution
300 _a57-64 p.
650 _aOptimal Design
_9166357
650 _aAccelerated Tests
_9682336
650 _aExponential Distribuions
_9757781
773 _d1991
_tReliability Engineering and System Safety
_x09518320
942 _cART
_o51
_pABUL KALAM Library
999 _c750178
_d750178