| 000 | 00587nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2000 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aKolodzey, James _9268157 |
||
| 100 |
_aChen, Shong-Chin _9781124 |
||
| 100 |
_aOlowolafe, Johnson Olufemi _9781125 |
||
| 245 | 0 | _aElectrical Conduction and Dielectric Breakdown in Aluminum Oxide Insulators on Silicon | |
| 300 | _a121-128 p. | ||
| 650 |
_aDielectric Breakdown _9742641 |
||
| 650 |
_aSemiconductor Dbr _9781126 |
||
| 650 |
_aMos Capacitor _9769357 |
||
| 773 |
_d2000 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c745508 _d745508 |
||