| 000 | 00595nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1999 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aIsaacson, Michael _9305572 |
||
| 100 |
_aBetta, R. A. Dalia _9780991 |
||
| 100 |
_aSoncini, G. _9780992 |
||
| 245 | 0 | _aonAccuracy of Generation lifetime Measurement in High-Resistivity Silicon Using Pn Gated Diodes | |
| 300 | _a817-819 p. | ||
| 650 |
_aGated Diode _9757974 |
||
| 650 |
_aGeneration lifetime _9780993 |
||
| 650 |
_aHigh-Reliability Organizations _9719471 |
||
| 773 |
_d1999 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c745460 _d745460 |
||