| 000 | 00553nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aMa, Zhengxiang _9780297 |
||
| 100 |
_aBecker, andrew J. _9780298 |
||
| 100 |
_aPolakos, P. _9780299 |
||
| 245 | 0 | _aRf Measyrement Technique for Characterizing Thin Dielectric Films | |
| 300 | _a1811-1816 p. | ||
| 650 |
_aCapacitance Measurement _9777238 |
||
| 650 | _aCapacitors | ||
| 650 |
_aDielectric Measurements _9780300 |
||
| 773 |
_d1998 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c745157 _d745157 |
||