| 000 | 00670nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aLou, Choon-Leong _9780235 |
||
| 100 |
_aChin, Wai-Kin _9780236 |
||
| 100 |
_aPan, Yang _9780238 |
||
| 245 | 2 | _aA Novel Single-Device Dc Method for Extraction OfEffective Mobility and Source-Drain Resistances of Fresh and Hot -Carrier Degraded Drain-Resistances of Fresh and Hot-Carrier Degraded Drain-Engineered Mosfet'S | |
| 300 | _a1317-1323 p. | ||
| 650 |
_aHot Carrier _9767189 |
||
| 650 |
_aMobility _9164527 |
||
| 650 |
_aMosfet _9720139 |
||
| 773 |
_d1998 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c745125 _d745125 |
||