000			00555nab a2200157Ia 4500
008			230808s1998 |||||||f |||| 00| 0 eng d
100			_aGadelrab, Serag M. _9778325
100			_aChamberlain, Savvas G. _9778326
245		0	_aImprovement OfReliability of Amorphous Silicon Transistors by Conduction-Band Tail Width Reduction
300			_a2179-2186 p.
650			_aAmorphous Silicon
650			_aAmorphous Sitability _9779647
650			_aEnergy Band Tails _9779648
773			_d1998 _tIEEE Transactions on Electron Devices _x00189383
942			_cART _o51 _pABUL KALAM Library
999			_c744863 _d744863