| 000 | 00573nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aBanna, Srinivasa R. _9776162 |
||
| 100 |
_aChan, Philip C. H. _9768417 |
||
| 100 |
_aFung, Samuel K. H. _9777392 |
||
| 245 | 2 | _aA Unified Understanding on Fuliy-Depleted Soi Nmosfet Hot-Carrier Degradation | |
| 300 | _a206-212 p. | ||
| 650 |
_aDegradation _9170999 |
||
| 650 |
_aFuliy-Depleted Soi Mosfet _9771955 |
||
| 650 |
_aHot Carrier _9767189 |
||
| 773 |
_d1998 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c744841 _d744841 |
||