| 000 | 00549nab a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aWang, Tahui _9777572 |
||
| 100 |
_aChang, Tse-En _9779059 |
||
| 100 |
_aBess, Vicki _9779060 |
||
| 245 | 0 | _aInvestigation of Oxide Charge Trapping and Detrapping in a Mosfet by Using a Gldl Current Technique | |
| 300 | _a1511-1517 p. | ||
| 650 |
_aGild _9779062 |
||
| 650 |
_aHot Carrier _9767189 |
||
| 650 |
_aOxide _983600 |
||
| 773 |
_d1998 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c744607 _d744607 |
||