| 000 | 00512nab a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aSatoh, Shinji _9718800 |
||
| 100 |
_aRozansky, David A _9778333 |
||
| 100 |
_aAritome, SeIIchi _9778334 |
||
| 245 | 0 | _aStress-Induced Leakage Current of Tunnel Oxide Derived from Flash Memory Read-Disturb Characteristics | |
| 300 | _a482-486 p. | ||
| 650 |
_aCharacteristic Speeds _9753625 |
||
| 773 |
_d1998 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c744298 _d744298 |
||