000 | 00545nab a2200169Ia 4500 | ||
---|---|---|---|
008 | 230808s1999 |||||||f |||| 00| 0 eng d | ||
100 |
_ali, Zhihong _9777904 |
||
100 |
_aWang, Yangyuan _9777905 |
||
100 |
_aSun, Ying _9760890 |
||
245 | 0 | _aNumerical Calculation of Electromigration Under Pulse Current with Joule Heating | |
300 | _a70-77 p. | ||
650 |
_aElectromigration _9777428 |
||
650 |
_aInterconnect _9715171 |
||
650 |
_aReliability _953955 |
||
773 |
_d1999 _tIEEE Transactions on Electron Devices _x00189383 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c744128 _d744128 |