000 00545nab a2200169Ia 4500
008 230808s1999 |||||||f |||| 00| 0 eng d
100 _ali, Zhihong
_9777904
100 _aWang, Yangyuan
_9777905
100 _aSun, Ying
_9760890
245 0 _aNumerical Calculation of Electromigration Under Pulse Current with Joule Heating
300 _a70-77 p.
650 _aElectromigration
_9777428
650 _aInterconnect
_9715171
650 _aReliability
_953955
773 _d1999
_tIEEE Transactions on Electron Devices
_x00189383
942 _cART
_o51
_pABUL KALAM Library
999 _c744128
_d744128