| 000 | 00503nab a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aChen, T.P. _9777744 |
||
| 100 |
_aLo, K. F. _9777745 |
||
| 100 |
_ali, Stelia _9777747 |
||
| 245 | 0 | _aInterface Trap Generation by Fn Injection Under Dynamic Oxide Field Stress | |
| 300 | _a1920-1926 p. | ||
| 650 |
_aIntegrated Circuit Reliability _9777748 |
||
| 650 | _aMosfets | ||
| 773 |
_d1998 _tIEEE Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c744061 _d744061 |
||