| 000 | 00530nab a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1995 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aRooks, S. M. _9776048 |
||
| 245 | 0 | _aDevelopment of an Inspection Process for Bali-Grid Array Technology Using Scanned-Beam X-Ray Laminography | |
| 300 | _a851-861 p. | ||
| 650 |
_aSolder-Joint Inspection _9768094 |
||
| 650 |
_aX-Ray Absorption Spectroscopy _9724136 |
||
| 773 |
_d1995 _tIEEE Transactions on Components Packaging and Manufacturing Technology Part A _x10709886 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c743412 _d743412 |
||