000 00607nab a2200169Ia 4500
008 230808s1995 |||||||f |||| 00| 0 eng d
100 _aAmagai, Masazumi
_9773514
100 _aEbe, Kazuyoshi
_9773515
100 _aSeno, Hideo
_9773517
245 0 _aCracking Failures in Lead-on Chip Packages Induced by Chip Backside Contamination
300 _a119-126 p.
650 _aWafer
_9712604
650 _aAdhesive
_9693759
650 _aPackage Modeling
_9767703
773 _d1995
_tIEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging
_x10709894
942 _cART
_o51
_pABUL KALAM Library
999 _c742315
_d742315