000 00480nab a2200157Ia 4500
008 230808s2003 |||||||f |||| 00| 0 eng d
100 _aXu, Haiyan
_9724105
100 _aTang, Yincai
_9773364
245 0 _aCommentary:Khamis/Higgins Model
300 _a04-06 p.
650 _aWeibuli Distribution
_9709157
650 _aCumulative Exposure Model
_9767504
650 _aKhamis/Higgins Model
_9773367
773 _d2003
_tIEEE Transactions on Reliability
_x00189529
942 _cART
_o51
_pABUL KALAM Library
999 _c742255
_d742255