000 | 00480nab a2200157Ia 4500 | ||
---|---|---|---|
008 | 230808s2003 |||||||f |||| 00| 0 eng d | ||
100 |
_aXu, Haiyan _9724105 |
||
100 |
_aTang, Yincai _9773364 |
||
245 | 0 | _aCommentary:Khamis/Higgins Model | |
300 | _a04-06 p. | ||
650 |
_aWeibuli Distribution _9709157 |
||
650 |
_aCumulative Exposure Model _9767504 |
||
650 |
_aKhamis/Higgins Model _9773367 |
||
773 |
_d2003 _tIEEE Transactions on Reliability _x00189529 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c742255 _d742255 |