000 | 00549nab a2200181Ia 4500 | ||
---|---|---|---|
008 | 230808s2003 |||||||f |||| 00| 0 eng d | ||
100 |
_aZhao, Jun _9744365 |
||
100 |
_aMeyer, F.J _9772973 |
||
100 |
_aLombardi, Fabrizio _9767027 |
||
100 |
_aPark, Nohpili _9767026 |
||
245 | 0 | _aMaximal Diagnosis of Interconnects of Random Access Memories | |
300 | _a423-434 p. | ||
650 | _aDiagnosis | ||
650 |
_aFault Models _9772975 |
||
650 |
_aInterconnect _9715171 |
||
773 |
_d2003 _tIEEE Transactions on Reliability _x00189529 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c742108 _d742108 |