000 00549nab a2200181Ia 4500
008 230808s2003 |||||||f |||| 00| 0 eng d
100 _aZhao, Jun
_9744365
100 _aMeyer, F.J
_9772973
100 _aLombardi, Fabrizio
_9767027
100 _aPark, Nohpili
_9767026
245 0 _aMaximal Diagnosis of Interconnects of Random Access Memories
300 _a423-434 p.
650 _aDiagnosis
650 _aFault Models
_9772975
650 _aInterconnect
_9715171
773 _d2003
_tIEEE Transactions on Reliability
_x00189529
942 _cART
_o51
_pABUL KALAM Library
999 _c742108
_d742108