000 00540nab a2200157Ia 4500
008 230808s1999 |||||||f |||| 00| 0 eng d
100 _aliao, Min
_9771348
100 _aShimokawa, Toshiyuki
_9771349
245 0 _aGoodness-Of-Fit Tests for Type-I Extreme-Value and 2-Parameter Weibuli Distributions
300 _a79-86 p.
650 _aCritical Value
_9764408
650 _aKolmogorov-Smirnov Statistic
_9771350
650 _aanderson-Darling Test
_9706014
773 _d1999
_tIEEE Transactions on Reliability
_x00189529
942 _cART
_o51
_pABUL KALAM Library
999 _c741454
_d741454