000 | 00540nab a2200157Ia 4500 | ||
---|---|---|---|
008 | 230808s1999 |||||||f |||| 00| 0 eng d | ||
100 |
_aliao, Min _9771348 |
||
100 |
_aShimokawa, Toshiyuki _9771349 |
||
245 | 0 | _aGoodness-Of-Fit Tests for Type-I Extreme-Value and 2-Parameter Weibuli Distributions | |
300 | _a79-86 p. | ||
650 |
_aCritical Value _9764408 |
||
650 |
_aKolmogorov-Smirnov Statistic _9771350 |
||
650 |
_aanderson-Darling Test _9706014 |
||
773 |
_d1999 _tIEEE Transactions on Reliability _x00189529 |
||
942 |
_cART _o51 _pABUL KALAM Library |
||
999 |
_c741454 _d741454 |