000 00481nab a2200145Ia 4500
008 230808s2000 |||||||f |||| 00| 0 eng d
100 _aFutatsuya, Masao
_9769192
245 0 _aPrediction Intervals for System lifetime, Based on Component Test Data
300 _a351-354 p.
650 _aExponential Distribution
_9706587
650 _aIndependent Component
_9675020
650 _aMonotonic
_9163867
773 _d2000
_tIEEE Transactions on Reliability
_x00189529
942 _cART
_o51
_pABUL KALAM Library
999 _c740601
_d740601