| 000 | 00481nab a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2000 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aFutatsuya, Masao _9769192 |
||
| 245 | 0 | _aPrediction Intervals for System lifetime, Based on Component Test Data | |
| 300 | _a351-354 p. | ||
| 650 |
_aExponential Distribution _9706587 |
||
| 650 |
_aIndependent Component _9675020 |
||
| 650 |
_aMonotonic _9163867 |
||
| 773 |
_d2000 _tIEEE Transactions on Reliability _x00189529 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c740601 _d740601 |
||