000 00407nab a2200121Ia 4500
008 230808s2013 |||||||f |||| 00| 0 eng d
100 _aRen, Ziyan
_9707619
100 _aKoh, Chang-Seop
_9707620
245 2 _aA Second-Order Design Sensitivity-Assisted Minte Carlos Simulation Method for Reliability Evaluation OfElectromagnetic Devices
300 _a780-786 p.
773 _d2013
_tMetcrux
942 _cART
_o51
_pABUL KALAM Library
999 _c722570
_d722570